Our portfolio of TeraSpike probes for reflection-mode measurements has been extended by two further models: the TSR.75 and the TSR-TT.75. The new series of Terahertz transceiver probes now serves a wider range of application scenarios, starting with volume inspection (TR.5), near-surface volume inspection with increased spatial resolution (TSR.75) and surface scanning with maximum spatial resolution (TSR-TT.75). While basically all TR series probes can be used also for transmission-mode operation, the TSR-TT.75 is best suited for this mode in respect of highest spatial resolution.
The TR series is taking advantage of Protemics´ proprietary “wave-trap” design for the suppression of probe-internal reflection signals as well as the XR-type flexible cantilever design for increased mechanical robustness. Our transceiver probes provides access to sub-wavelength-resolution and shortest THz transmissions paths.
Model TD-800- ... | Operation mode | # of Antennas | Incidence angle [deg] | Bandwidth [THz] | Spatial Resolution [µm] |
TR.5 | Reflection | 2 | 0 | 1.5 | 250 |
TSR.75-PCS10-50 | Reflection | 2 | 15 | 3 | 100 |
TSR-TT.75-PCS10-50 | Reflection and Transmission | 1 | 0 | 2 | 40 |
For more information please refer to our product brochure (2 MB PDF-file) and take a look into our FAQ section.
TR series probes are based on the patent applications DE 10 2009 000 823.3, DE 10 2014 015 516.1, DE 10 2016 002 733.9, DE 10 2020 002 735.0.
The new TeraSpike model TR.5 comes with a pair of closely spaced photoconductive THz antennas offering new means for high-performance near-field measurements in reflection-mode. While one antenna is used as a radiation pulse generator, the other antenna is used as the detector. The slim transceiver probe is taking advantage of Protemics´ proprietary “wave-trap” design for the suppression of probe-internal reflection signals as well as the XR-type flexible PET cantilever design for increased mechanical robustness. In contrast to standard reflection-mode approaches based on far-field emitter/detector components the new near-field transceiver probe provides access to sub-wavelength-resolution and shortest THz transmissions paths.
Type | -TR.5 | |
Dark current @ 1 V Bias | < 1.5 nA | |
Photocurrent @ 1 V Bias | > 0.5 µA | |
Excitation wavelength | 700 .. 860 nm | |
Average excitation power | 0.1 .. 4 mW | |
Connection type | 2x SMP |
Each probe is individually tested and comes with manual and test certificate. For more information please refer to our product brochure (2 MB PDF-file) and take a look into our FAQ section.
Type | TRS.75-PCS10-50 |
Max. spatial resolution | 100 µm |
Dark current @ 1 V Bias | < 10 nA (typ. < 1.5 nA) |
Photocurrent @ 1 V Bias | >0.1 µA (typ. >0.25 µA) |
Excitation wavelength | 700 .. 860 nm |
Average excitation power | 0.1 .. 3 mW |
Connection type | 2x SMP |
TR-series microprobes are mainly sensitive to THz field components oriented in transversal direction to the probe-tip axis as defined by the x-axis direction in the upper illustration.
Each probe is individually tested and comes with a manual & test certificate. For further information please take a look at our brochure (PDF file, 2 MB) and FAQ section.
*Sample ICs courtesy of Dr. Asadi’s group, Florida Institute for Cybersecurity Research (FICS). Stacked interface and buried structure localization based on Protemics' software package Teraloc - optimized for TeraSpike-probes.
Type | TRS-TT.75-PCA-PCS10-50 |
Max. spatial resolution | 40 µm |
Dark current @ 1 V Bias | < 10 nA (typ. <1.5 nA) |
Photocurrent @ 1 V Bias | >0.1 µA (typ. >0.25 µA) |
Excitation wavelength | 700 .. 860 nm |
Average excitation power | 0.1 .. 3 mW |
Connection type | 2x SMP |
TR-series microprobes are mainly sensitive to THz field components oriented in transversal direction to the probe-tip axis as defined by the x-axis direction in the upper illustration.
Each probe is individually tested and comes with a manual & test certificate. For further information please take a look at our brochure (PDF file, 2 MB) and FAQ section.
*Terahertz test target P-TTT-2-1200 with Cr layers of 10 nm and 50 nm thickness - equivalent to approx. 250 Ohm and 50 Ohm sheet resistance, respectively.