A NEW WAY TO SEE
Unlocking Deeper Material Insights with Advanced THz Technology
Our unique THz microprobe devices are breaking the limits of conventional THz imaging tools and open a new path to micron-scale resolution contactless near-field measurements.
Learn MoreApplication Areas
Thin-film Inspection 
Contact-less wafer analysis from sheet-resistance to carrier mobility
Contact-less wafer analysis from sheet-resistance to carrier mobility
Terahertz Research 
Get broadband access to THz near-field information
Get broadband access to THz near-field information
Chip Testing 
From chip integrity to fault location
From chip integrity to fault location
Volume Screening 
See micro-defects buried in visually opaque materials
See micro-defects buried in visually opaque materials
Thin-film Inspection
Characterize wafers, solar cells, displays, flexible electronics, and 2D materials (graphene) with non-destructive, contactless probing. Map sheet resistance and carrier mobility at micron-scale resolution.
Terahertz Research
Explore the near-field of metamaterials, plasmonic structures, emitters, waveguides, sensor surfaces, graphene, and more with high-sensitivity, low-invasiveness THz microprobes.
Chip Testing
High-resolution time-domain reflectometry for advanced fault isolation, packaging level inspection, and on-chip THz device characterization. Achieve sub-picosecond resolution with contactless, non-destructive operation.
Volume Screening
Inspect plastic laser welds, fiber-reinforced polymers, organic layers, and more with non-destructive THz imaging. Detect micron-scale defects even in visually opaque materials.
Application highlight
Terahertz On-chip Imaging
A NEW WAY TO SEE: Ultra-fast processes.
Delve into the realm of ultrafast electrodynamics. Discover how real-world phenomena taking place in picoseconds can be visualized using a TeraCube M2 THz near-field imaging system.
A NEW WAY TO SEE: Real-world ultra-fast processes captured with the TeraCube M2.
Recent news
Product news On-chip THz TDS
From the labs How chiral fermions move
From the labs Chip integrity testing
Product news New TxRx probes now available!
From the labs
Researchers from the SKKU and collaborating partners have reported a world-first success in monitoring the spatio-temporal motion of chiral fermions.
From the labs
The Florida Institute for Cybersecurity Research at the University of Florida - a pioneer in the development of new test methods for detecting security-relevant hardware modifications - is now taking chip integrity testing a step further with a TeraCube scanner system.
Product news
Our TR probe series has been extended by two models offering higher bandwidth and improved spatial resolution.
Products
We develop and manufacture components, sub-systems and full system solutions for high-resolution THz imaging applications.
Click image title on the right for product group details.
© Protemics GmbH
Click image title on the right for product group details.
© Protemics GmbH
People at Protemics
Alexander Michalski Developer
Physicist, developer of data analysis software and optoelectronic systems.
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2014 - 2025
Protemics GmbH