Terahertz micro-probing solutions by protemics
A NEW WAY TO SEE
Our unique THz microprobe devices are breaking the limits of conventional THz imaging tools and open a new path to micron-scale resolution contactless near-field measurements.
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THz pulse on CPS - measured with a TeraCube M2 near-field imaging system.
Application Areas
Thin-film Inspection Wafer-scale measurements from sheet-resistance to carrier mobility
Terahertz Research Get broadband access to THz near-fields
Volume Screening See micro-defects buried in visually opaque materials
Chip Testing On-chip measurements from 50 GHz to 2 THz
Thin-film Inspection
Non-destructive testing of wafers, solar cells, displays, flexible electronics and 2D materials (graphene).
Benefit from contactless probing for sheet resistance and carrier mobility imaging at micron-scale resolution. Large wafer-scale areas can be mapped at high-speeds.
Terahertz Research
Investigate Metamaterials,
Plasmonic structures, Emitters, Waveguides, Sensor surfaces, Graphene and more. Benefit from direct near-field access, cost-efficient system-extension options, high-sensitivity and low-invasiveness provided by our THz micro-probes.
Volume Screening
Inspection of plastic laser welds, fiber inforced polymers, organic layers and other materials.
Benefit from our non-destructive & fast inspection method. Find micron-scale defects buried in Vis/IR opaque but THz transparent material.
Chip Testing
Fault isolation, packaging level inspection or on-chip THz device characterization.
Benefit from market leading time-domain reflectometry resolution, sub-ps pulse rise-times, contactless and non-destructive operation.
Recent news
Product news On-chip THz TDS
From the labs How chiral fermions move
From the labs Chip integrity testing
Product news New TxRx probes now available!
From the labs
Researchers from the SKKU and collaborating partners have reported a world-first success in monitoring the spatio-temporal motion of chiral fermions.
From the labs
The Florida Institute for Cybersecurity Research at the University of Florida - a pioneer in the development of new test methods for detecting security-relevant hardware modifications - is now taking chip integrity testing a step further with a TeraCube scanner system.
Product news
Our TR probe series has been extended by two models offering higher bandwidth and improved spatial resolution.
Products
We develop and manufacture components, sub-systems and full system solutions for high-resolution THz imaging applications.
Click image title on the right for product group details.
© Protemics GmbH
Click image title on the right for product group details.
© Protemics GmbH
People at Protemics
Alexander Michalski Developer
Physicist, developer of data analysis software and optoelectronic systems.
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2014 - 2024
Protemics GmbH