Microprobe cantilever design:
|Max. spatial resolution||40 µm|
|Dark current @ 1 V Bias||< 10 nA (typ. <1.5 nA)|
|Photocurrent @ 1 V Bias||>0.1 µA (typ. >0.25 µA)|
|Excitation wavelength||700 .. 860 nm|
|Average excitation power||0.1 .. 3 mW|
|Connection type||2x SMP|
TR-series microprobes are mainly sensitive to THz field components oriented in transversal direction to the probe-tip axis as defined by the x-axis direction in the upper illustration.
Each probe is individually tested and comes with a manual & test certificate. For further information please take a look at our brochure (PDF file, 2 MB) and FAQ section.
Application example (Thin-film inspection*):
*Terahertz test target P-TTT-2-1200 with Cr layers of 10 nm and 50 nm thickness - equivalent to approx. 250 Ohm and 50 Ohm sheet resistance, respectively.