tr series probes

Our portfolio of TeraSpike probes for reflection-mode measurements has been extended by two further models: the TSR.75 and the TSR-TT.75. The new series of Terahertz transceiver probes now serves a wider range of application scenarios, starting with volume inspection (TR.5), near-surface volume inspection with increased spatial resolution (TSR.75) and surface scanning with maximum spatial resolution (TSR-TT.75). While basically all TR series probes can be used also for transmission-mode operation, the TSR-TT.75 is best suited for this mode in respect of highest spatial resolution.

The TR series is taking advantage of Protemics´ proprietary “wave-trap” design for the suppression of probe-internal reflection signals as well as the XR-type flexible cantilever design for increased mechanical robustness. Our transceiver probes provides access to sub-wavelength-resolution and shortest THz transmissions paths.

TR series comparison chart:
 Model TD-800- ... Operation mode # of Antennas Incidence angle [deg] Bandwidth [THz]  Spatial Resolution [µm]
 TR.5  Reflection 2 0 1.5  250
 TSR.75-PCS10-50  Reflection  2 15 3 100
 TSR-TT.75-PCS10-50  Reflection and Transmission 1 0 2 40

 

For more information please refer to our product brochure (2 MB PDF-file) and take a look into our FAQ section.

TR series probes are based on the patent applications DE 10 2009 000 823.3, DE 10 2014 015 516.1, DE 10 2016 002 733.9, DE 10 2020 002 735.0.

 

 

 

Full image TxRx ppt 550

The new TeraSpike model TR.5 comes with a pair of closely spaced photoconductive THz antennas offering new means for high-performance near-field measurements in reflection-mode. While one antenna is used as a radiation pulse generator, the other antenna is used as the detector. The slim transceiver probe is taking advantage of Protemics´ proprietary “wave-trap” design for the suppression of probe-internal reflection signals as well as the XR-type flexible PET cantilever design for increased mechanical robustness. In contrast to standard reflection-mode approaches based on far-field emitter/detector components the new near-field transceiver probe provides access to sub-wavelength-resolution and shortest THz transmissions paths.

Microprobe antenna design:

Antenna designs TxRx

 

Technical specifications:
Type -TR.5
 Dark current @ 1 V Bias < 1.5 nA
 Photocurrent @ 1 V Bias > 0.5 µA
 Excitation wavelength 700 .. 860 nm
 Average excitation power 0.1 .. 4 mW
 Connection type 2x SMP

 

Each probe is individually tested and comes with manual and test certificate. For more information please refer to our product brochure (2 MB PDF-file) and take a look into our FAQ section.

 

 

 TSR.75 Photo2
Microprobe cantilever design: 

TSR scheme

Technical specifications: 
Type TRS.75-PCS10-50
 Max. spatial resolution 100 µm
 Dark current @ 1 V Bias < 10 nA (typ. < 1.5 nA)
 Photocurrent @ 1 V Bias >0.1 µA (typ. >0.25 µA)
 Excitation wavelength 700 .. 860 nm
 Average excitation power 0.1 .. 3 mW
 Connection type 2x SMP

 

TR-series microprobes are mainly sensitive to THz field components oriented in transversal direction to the probe-tip axis as defined by the x-axis direction in the upper illustration.  

Each probe is individually tested and comes with a manual & test certificate. For further information please take a look at our brochure (PDF file, 2 MB) and FAQ section.

Application example (IC authenticity verification*): 

TSR application

*Sample ICs courtesy of Dr. Asadi’s group, Florida Institute for Cybersecurity Research (FICS). Stacked interface and buried structure localization based on Protemics' software package Teraloc - optimized for TeraSpike-probes.

 

TSR-TT
Microprobe cantilever design: 

TSR-TT scheme

Technical specifications: 
Type TRS-TT.75-PCA-PCS10-50
 Max. spatial resolution 40 µm
 Dark current @ 1 V Bias < 10 nA (typ. <1.5 nA)
 Photocurrent @ 1 V Bias >0.1 µA (typ. >0.25 µA)
 Excitation wavelength 700 .. 860 nm
 Average excitation power 0.1 .. 3 mW
 Connection type 2x SMP

 

TR-series microprobes are mainly sensitive to THz field components oriented in transversal direction to the probe-tip axis as defined by the x-axis direction in the upper illustration.  

Each probe is individually tested and comes with a manual & test certificate. For further information please take a look at our brochure (PDF file, 2 MB) and FAQ section.

Application example (Thin-film inspection*): 

TSR-TT application

*Terahertz test target P-TTT-2-1200 with Cr layers of 10 nm and 50 nm thickness - equivalent to approx. 250 Ohm and 50 Ohm sheet resistance, respectively.