Sheet resistance imaging

Sheetres-top solarpet2

Through contactless transmission measurements the TeraSpike microprobe is giving you direct access to the sheet resistance information of thin-film conductors at micron-scale resolution. This new technology provides considerably higher resolution than any other contactless method on the market being applicable to measurements of large-scale areas (as for example: Eddy-current, or microwave-based systems).

 

Applications

Analysis and inspection of:

  • Transparent conductors based on ITO or emerging non-ITO materials as used for
    • Flexible or curved touch sensors and displays
    • OLEDs
    • (Thin-film) solar cell
    • Smart windows
    • EM shielding
  • Semiconductor doping layers
  • Metal-mesh layers
  • Silver nanowire coatings
  • PEDOT:PSS
  • Flexible electronics
  • Graphene and carbon nanotube layers
  • Thin-film metals

 

 Key features

  • Contact-free
  • Non-destructive & non-invasive
  • High speed: up to 5ms/pixel
  • High spatial resolution: up to 3 µm
  • Registration of slit defects of nm-scale width
  • Wide measurement range 1 – 2000 Ω/□
  • Applicable to layers buried under isolators
  • Applicable on flat, curved or rough surfaces (insensitive to optical scattering)
  • No parasitic sensitivity to carrier lifetime variations

 

Measurement examples:

Graphene Display 3D samsung techwin 600

Sheet conductivity image measured at a structured graphene on PET foil sample. Data publication with kind permission of SAMSUNG TECHWIN. 

 

Rolith-sample-600

Sheet resistance image measured at a 6"-diameter metal-mesh on glass wafer featuring sub-micrometer-wide metal lines. Data publication with kind permission of Rolith Inc.

Protemics is offering measurement services, conduction of reseach studies as well as technology development services.

Please do not hesitate to Contact us h35 for further information or sent us a Quote request h35.