Our scanning system solutions are the ideal modular platform for THz near-field imaging applications of any kind. All system components are optimized for the utilization of TeraSpike microprobes at maxmimum performance.
Standard scanning system configurations may be combined with a suitable laser systems on customer side or can be extended with a new laser source for optical excitation.
Scanning systems are designed for applications such as:
- THz Metamaterial research and sensing application
- Semiconductor wafer inspection
- Sheet resistance imaging
- Graphene analysis
- THz device characterization
- Microstructure analysis
- Non-destructive testing