Scanning systems

Our scanning system solutions are the ideal modular platform for THz near-field imaging applications of any kind. All system components are optimized for the utilization of TeraSpike microprobes at maxmimum performance.

Standard scanning system configurations may be combined with a suitable laser systems on customer side or can be extended with a new laser source for optical excitation.

Scanning systems are designed for applications such as:  

  • THz Metamaterial research and sensing application
  • Semiconductor wafer inspection
  • Sheet resistance imaging
  • Graphene analysis
  • THz device characterization
  • Microstructure analysis
  • Non-destructive testing