• TeraSpike on Solarcell
  • Chip testing
  • THz near-field imaging
  • Cleanroom wafer
  • THz-Nano-Analytics
  • AMICA building

Welcome to Protemics GmbH

We develop and manufacture innovative measurement products and offer services utilizing light from the terahertz (THz) frequency range. Our unique THz microprobe devices are breaking the limits of conventional THz imaging tools and open a new path to micron-scale resolution contactless near-field measurements. 

Terahertz Research

Thin-film testing

Chip testing

Volume screening

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Application areas:

  • Metamaterials
  • Plasmonics
  • Passive devices
  • Emitters
  • Antennas
  • Waveguides
  • Sensor surfaces
  • Graphene


  • Near-field access
  • Cost-efficient system extension
  • High-sensitivity
  • Low-invasiveness
  • Polarisation sensitive
  • Broadband

Application areas:

  • Solar cells
  • Displays
  • Flexible electronics
  • Semiconductors 
  • Graphene
  • Transparent conductors


  • Sheet resistance imaging
  • Contactless
  • Micron-scale resolution
  • Large-area scanning
  • High-speed scanning

 Application areas:

  • Time-domain reflectometry
  • Fault isolation
  • Packaging level inspection
  • 3D integration
  • Through silicon via (TSV)


  • Market leading TDR resolution
  • Sub-ps rise-times
  • Contactless
  • Non-destructive
  • Cost advantage over all-electronic systems

 Application areas:

  • Plastic laser weld seam inspection
  • Fiber inforced polymers
  • Chip underfill inspection
  • Organic layer screening


  • Non-destructive
  • Fast inspection
  • Screening of Vis/IR opaque plastics
  • Detection of micron-scale structures
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Dutch researches demonstrate TeraSpike at optically excited semiconductors

One of the most important applications of the TeraSpike probe lies in the field of wafer analysis. So far, it has been mainly used to probe wafer material properties such as sheet resistance or charge carrier mobility under normal ambient conditions. Now a team of researchers from the Dutch institutes DIFFER and Eindhoven University of Technology succeeded in demonstrating the use of the TeraSpike near-field probe for measurements of wafer conductivity under short pulse optical excitation. 

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Laser Focus World features Terahertz Microprobe-based Inspection

This months issue of the Laser Focus World Magazine is featuring an article about Protemics THz microprobe technology applied to different inspection applications. The operation of the TeraCube near-field imaging system with a modern fiber-based time-domain spectroscopy module is also highlighted.

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Advanced THz Metamaterials - Caught in the act

Researchers from the Dutch institute DIFFER, Eindhoven, demonstrate an elegant way to enhance electro-magnetically induced transparency in meta-materials without being constraint by the resolution limitations of fabrication tools. While earlier methods relied on

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