• TeraSpike on Solarcell
  • Chip testing
  • THz near-field imaging
  • Cleanroom wafer
  • THz-Nano-Analytics
  • AMICA building

Welcome to Protemics GmbH

We develop and manufacture innovative measurement products and offer services utilizing light from the terahertz (THz) frequency range. Our unique THz microprobe devices are breaking the limits of conventional THz imaging tools and open a new path to micron-scale resolution contactless near-field measurements. 

Terahertz Research

Thin-film testing

Chip testing

Volume screening

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Application areas:

  • Metamaterials
  • Plasmonics
  • Passive devices
  • Emitters
  • Antennas
  • Waveguides
  • Sensor surfaces
  • Graphene


  • Near-field access
  • Cost-efficient system extension
  • High-sensitivity
  • Low-invasiveness
  • Polarisation sensitive
  • Broadband

Application areas:

  • Solar cells
  • Displays
  • Flexible electronics
  • Semiconductors 
  • Graphene
  • Transparent conductors


  • Sheet resistance imaging
  • Contactless
  • Micron-scale resolution
  • Large-area scanning
  • High-speed scanning

 Application areas:

  • Time-domain reflectometry
  • Fault isolation
  • Packaging level inspection
  • 3D integration
  • Through silicon via (TSV)


  • Market leading TDR resolution
  • Sub-ps rise-times
  • Contactless
  • Non-destructive
  • Cost advantage over all-electronic systems

 Application areas:

  • Plastic laser weld seam inspection
  • Fiber inforced polymers
  • Chip underfill inspection
  • Organic layer screening


  • Non-destructive
  • Fast inspection
  • Screening of Vis/IR opaque plastics
  • Detection of micron-scale structures
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Laser Focus World features Terahertz Microprobe-based Inspection

This months issue of the Laser Focus World Magazine is featuring an article about Protemics THz microprobe technology applied to different inspection applications. The operation of the TeraCube near-field imaging system with a modern fiber-based time-domain spectroscopy module is also highlighted.

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Advanced THz Metamaterials - Caught in the act

Researchers from the Dutch institute DIFFER, Eindhoven, demonstrate an elegant way to enhance electro-magnetically induced transparency in meta-materials without being constraint by the resolution limitations of fabrication tools. While earlier methods relied on

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Product news: All electronic Schottky-diode-based near-field probe series GigaSpike

We proudly present our first all-electronic field probe device series called "GigaSpike" enabling fast and cost-efficient measurements of sub-THz and millimeter-wave range electric field amplitudes. The new active GigaSpike probes are based on zero-bias Schottky diodes Read more ...